Parallel electron-hole bilayer conductivity from electronic interface reconstruction.
نویسندگان
چکیده
The perovskite SrTiO3-LaAlO3 structure has advanced to a model system to investigate the rich electronic phenomena arising at polar oxide interfaces. Using first principles calculations and transport measurements we demonstrate that an additional SrTiO3 capping layer prevents atomic reconstruction at the LaAlO3 surface and triggers the electronic reconstruction at a significantly lower LaAlO3 film thickness than for the uncapped systems. Combined theoretical and experimental evidence (from magnetotransport and ultraviolet photoelectron spectroscopy) suggests two spatially separated sheets with electron and hole carriers, that are as close as 1 nm.
منابع مشابه
Supplementary information for ”Parallel electron-hole bilayer conductivity from electronic interface reconstruction”
R. Pentcheva,1 M. Huijben,2 K. Otte,1 W.E. Pickett,3 J.E. Kleibeuker,2 J. Huijben,2 H. Boschker,2 D. Kockmann,2 W. Siemons,4 G. Koster,2 H.J.W. Zandvliet,2 G. Rijnders,2 D.H.A. Blank,2 H. Hilgenkamp,2 and A. Brinkman2 Department of Earth and Environmental Sciences, University of Munich, Germany Faculty of Science and Technology and MESA Institute for Nanotechnology, University of Twente, The Ne...
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عنوان ژورنال:
- Physical review letters
دوره 104 16 شماره
صفحات -
تاریخ انتشار 2010